The following table gives an overview of the techniques available at ELMICAU and the corresponding properties they can measure, alongside the best resolution that can be reached. 

 

	elemental composition		morphology		surface topology	magnetic structure	chemical map	crystalline structure	special
	2D	3D	2D	3D
TEM imaging			< 0.1 nm						strain/stress
TEM/STEM diffraction								< 1 nm
TEM Lorentz mode						< 10 nm
HAADF (STEM)			< 0.1 nm
EELS (TEM/STEM)	< 0.1 nm						< 0.1 nm
EDX (TEM/STEM)	< 0.1 nm
HRSTEM imaging			< 0.1 nm					< 0.1 nm
DPC (STEM)						< 10 nm			E-fields:  < 0,1 nm
Lorentz-STEM (Cs-corrected)						< 1 nm
SE (SEM)					< 5 nm				large-scale images possible
BSE (SEM)	< 10 nm
EDX (SEM)	< 50 nm
EBSD (SEM)								< 20 nm	grain orientation
Auger (AES)	< 5 nm
TEM/STEM tomography		< 10 nm		< 10 nm
FIB tomography		< 100 nm		< 100 nm
Auger tomography		< 5 nm		< 5 nm

 

                Elemental composition: differentiation between different elements.

                Morphology: the physical texture of the sample, i.e. granular, single-crystalline, amorphous, etc. 

                Surface topology: the texture of the sample surface.

                Magnetic structure: magnetic domains or domain walls, spin structures like vortices or skyrmions.

                Chemical map: differentiation between different elements and their chemical state, e.g. different oxidation levels.

                Crystalline structure: Bravais lattice and lattice constants.

 

This table can be used to find a suitable technique for inquiry regarding certain properties. However, the list is not exhaustive, and conversation with the professional ELMICAU staff is still the best way for finding the right technique for your situation.