Our Fourier-Transform Infrared (FTIR) spectrometers allow measurements in reflection and transmission from the far-infrared up to the visible spectral range. By using an infrared microscope coupled to the spectrometer, also very small samples can be measured.

For measurements under extreme conditions, the samples are mounted in optical cryostats, which enable experiments at low temperatures or simultaneously at high pressures.

For high-pressure measurements, the samples are mounted inside a diamond anvil cell, which enables pressures up to approximately 20 GPa. The maximum pressure is dependent on the culet size (900, 800, 600, 500 µm) of the diamond anvil.

With our evaporation unit, we are able to evaporate materials like silver and gold on various substrates.

The UV-VIS spectrometer is used to carry out measurements in the ultraviolet and visible range with the use of a CCD-spectrograph.

A self built infrared microscope prototype allows us to measure even simultaneously at low temperatures and high pressures.

The EDX spectrometer is used to investigate materials by energy dispersive x-ray spectroscopy, in order to determine film thicknesses or elemental compositions.

The atomic force microscope is used to scan surfaces with a very high resolution to measure forces on the order of fractions of nanometers.

A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.