The Electron Microscopy Center of Augsburg University (ELMICAU) is a scientific institution that offers a wide range of material analysis techniques on a local level. The main focus is on the two different types of electron microscope: the transmission electron microscope (TEM) and the scanning electron microscope (SEM). Further, the center is equipped with a focused ion beam (FIB) device.

In conjunction, the devices offer a multitude of investigation possibilities at various scales, ranging from multiple micrometers to fractions of nanometers. With high-resolution techniques such as HR-STEM, even atomic resolution is possible. Although SEM cannot provide atomic resolution and investigation of samples is limited to the surface area, a laborious preparation of the sample, as is needed for TEM investigation, is not necessary for SEM. This allows for simple, non-destructive measurements.

A special expertise of the center is the three-dimensional analysis of samples. This can be achieved via TEM, where tomography series of the sample are recorded by tilting, or via FIB, where layer by layer of the sample is removed and the surface is analyzed between each step. A similar procedure can also be performed in the Auger microscope. On top of the classical methods of electron microscopy, the microscopes can further investigate e.g. magnetic structures (Lorentz-mode), the orientation of crystalline grains (EBSD), or the distribution of elemental composition (EDX/EELS).

ELMICAU is funded by the Deutsche Forschungsgemeinschaft (DFG project 540566574).

Follow the links below for more information on the devices and measurement techniques.

In case of interest concerning measurements, please contact the coordinator or the scientific management.