Scanning Probe Microscope (AFM/MFM)

For the characterization of the magnetic domain structures and the surface morphologies of nanoscale devices and structures, we use a custom-modified Bruker Dimension ICON3 scanning probe microscope allowing for various scanning probe measurements (i.e. AFM, MFM) at room temperature.


Picture of AFM/MFM setup
Main components of AFM (MFM) setup
Magnetic force microscopy: concept of “lift mode” measurements.