High temperature resistivity and Seebeck measurements

The high temperature Seebeck and resistivity setup (HTS) is used for the electrical characterization of thermoelectric thin film samples between room temperature and 450°C under vacuum conditions or in nitrogen atmosphere. The Van der Pauw technique is used for the determination of the electrical conductivity of samples with a size of (10 ± 2) mm × (10 ± 2) mm.

The Seebeck coefficient is done in a two-point-configuration in order to minimize the error of the temperature measurement. Here the sample size is in the range of (14 ± 9) mm × (5 ± 2) mm.



Fig.1 - View of the heating elements and the measuring contacts
Fig. 2 - On the left: The vacuum chamber, on the right: the measuring devices